IJERGS · Volume 2, Issue 3 · May-June 2014 Edition
LOW POWER TEST PATTERN GENERATION IN BIST SCHEMES
| Journal | International Journal of Engineering Research and General Science (IJERGS) |
|---|---|
| ISSN | 2091-2730 |
| Volume | 2 |
| Issue | 3 |
| Edition | May-June 2014 Edition |
| Year | 2014 |
| Pages | page 162-167 |
| Publisher | P&R Publication |
How to cite
Yasodharan S, Swamynathan S M (2014). LOW POWER TEST PATTERN GENERATION IN BIST SCHEMES. International Journal of Engineering Research and General Science, 2(3), 162-167. ISSN 2091-2730. https://www.ijergs.org/article/v2-i3-20.html